TY - GEN
T1 - Study of board-level noise filters to prevent transient-induced latchup in CMOS integrated circuits During EMC/ESD test
AU - Hsu, Sheng Fu
AU - Ker, Ming-Dou
PY - 2006/11/21
Y1 - 2006/11/21
N2 - Different types of board-level noise filters are evaluated for their effectiveness to improve the immunity of CMOS ICs against transient-induced latchup (TLU) under system-level electrostatic discharge (ESD) test. By choosing proper components in each noise filter network, the TLU immunity of CMOS ICs can be greatly improved. All the experimental evaluations have been verified in test chips with the silicon controlled rectifier (SCR) fabricated in a 0.25-μm CMOS technology. Some of such board-level solutions can be further integrated into the chip design to effectively improve TLU immunity of CMOS IC products.
AB - Different types of board-level noise filters are evaluated for their effectiveness to improve the immunity of CMOS ICs against transient-induced latchup (TLU) under system-level electrostatic discharge (ESD) test. By choosing proper components in each noise filter network, the TLU immunity of CMOS ICs can be greatly improved. All the experimental evaluations have been verified in test chips with the silicon controlled rectifier (SCR) fabricated in a 0.25-μm CMOS technology. Some of such board-level solutions can be further integrated into the chip design to effectively improve TLU immunity of CMOS IC products.
UR - http://www.scopus.com/inward/record.url?scp=33751048111&partnerID=8YFLogxK
U2 - 10.1109/EMCZUR.2006.214989
DO - 10.1109/EMCZUR.2006.214989
M3 - Conference contribution
AN - SCOPUS:33751048111
SN - 3952299049
SN - 9783952299043
T3 - 17th International Zurich Symposium on Electromagnetic Compatibility, 2006
SP - 533
EP - 536
BT - 17th International Zurich Symposium on Electromagnetic Compatibility, 2006
T2 - 17th International Zurich Symposium on Electromagnetic Compatibility, 2006
Y2 - 27 February 2006 through 3 March 2006
ER -