Study of a super-resolution optical structure: Polycarbonate/ZnS-SiO2/ZnO/ZnS-SiO2/Ge2Sb2 Te5/ZnS-SiO2

Wei Chih Lin, Tsung-Sheng Kao, Hsun Hao Chang, Yu Hsuan Lin, Yuan Hsin Fu, Chien Ting Wu, Kuei Hsien Chen, Ding Ping Tsai*

*此作品的通信作者

研究成果: Article同行評審

38 引文 斯高帕斯(Scopus)

摘要

A new super-resolution near-field optical structure was demonstrated. The structure, polycarbonate/ZnS-SiO2(130 nm)/ZnO(15 nm)/ZnS-SiO2(30 nm)/Ge2Sb2Te5(15 nm)/ ZnS-SiO2(20 nm), has the ability in recording the small marks beyond the diffraction limit. At a readout power of 5 mW, the carrier to noise ratio (CNR) of more than 33 dB was measured for the recorded marks with the size of 100 nm by a digital versatile disc (DVD) tester. Transmission electron microscope (TEM) images of such structure displayed local orderly nanograins in 15 nm ZnO thin film. Ensemble effects of these ZnO nanostructures of the active layer are the key of the near-field super-resolution.

原文English
頁(從 - 到)1029-1030
頁數2
期刊Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
42
發行號2 B
DOIs
出版狀態Published - 2月 2003

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