Study of a super-resolution optical structure: Polycarbonate/ZnS-SiO2/ZnO/ZnS-SiO2/Ge2Sb2 Te5/ZnS-SiO2

Wei Chih Lin; Tsung-Sheng Kao; Hsun Hao Chang; Yu Hsuan Lin; Yuan Hsin Fu; Chien Ting Wu; Kuei Hsien Chen; Ding Ping Tsai

doi:10.1143/JJAP.42.1029

Study of a super-resolution optical structure: Polycarbonate/ZnS-SiO₂/ZnO/ZnS-SiO₂/Ge₂Sb₂Te₅/ZnS-SiO₂

Wei Chih Lin, Tsung-Sheng Kao, Hsun Hao Chang, Yu Hsuan Lin, Yuan Hsin Fu, Chien Ting Wu, Kuei Hsien Chen, Ding Ping Tsai^*

^*此作品的通信作者

光電工程學系

研究成果: Article › 同行評審

38 引文斯高帕斯（Scopus）

摘要

A new super-resolution near-field optical structure was demonstrated. The structure, polycarbonate/ZnS-SiO₂(130 nm)/ZnO(15 nm)/ZnS-SiO₂(30 nm)/Ge₂Sb₂Te₅(15 nm)/ ZnS-SiO₂(20 nm), has the ability in recording the small marks beyond the diffraction limit. At a readout power of 5 mW, the carrier to noise ratio (CNR) of more than 33 dB was measured for the recorded marks with the size of 100 nm by a digital versatile disc (DVD) tester. Transmission electron microscope (TEM) images of such structure displayed local orderly nanograins in 15 nm ZnO thin film. Ensemble effects of these ZnO nanostructures of the active layer are the key of the near-field super-resolution.

原文	English
頁（從 - 到）	1029-1030
頁數	2
期刊	Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
卷	42
發行號	2 B
DOIs	https://doi.org/10.1143/JJAP.42.1029
出版狀態	Published - 2月 2003

存取文件

10.1143/JJAP.42.1029

其它文件與鏈接

Link to publication in Scopus

引用此

@article{117d458023574de496fe06fc877742d8,

title = "Study of a super-resolution optical structure: Polycarbonate/ZnS-SiO2/ZnO/ZnS-SiO2/Ge2Sb2 Te5/ZnS-SiO2",

abstract = "A new super-resolution near-field optical structure was demonstrated. The structure, polycarbonate/ZnS-SiO2(130 nm)/ZnO(15 nm)/ZnS-SiO2(30 nm)/Ge2Sb2Te5(15 nm)/ ZnS-SiO2(20 nm), has the ability in recording the small marks beyond the diffraction limit. At a readout power of 5 mW, the carrier to noise ratio (CNR) of more than 33 dB was measured for the recorded marks with the size of 100 nm by a digital versatile disc (DVD) tester. Transmission electron microscope (TEM) images of such structure displayed local orderly nanograins in 15 nm ZnO thin film. Ensemble effects of these ZnO nanostructures of the active layer are the key of the near-field super-resolution.",

keywords = "Near-field optics, Super-resolution near-field structure (super-RENS), ZnO film",

author = "Lin, {Wei Chih} and Tsung-Sheng Kao and Chang, {Hsun Hao} and Lin, {Yu Hsuan} and Fu, {Yuan Hsin} and Wu, {Chien Ting} and Chen, {Kuei Hsien} and Tsai, {Ding Ping}",

year = "2003",

month = feb,

doi = "10.1143/JJAP.42.1029",

language = "English",

volume = "42",

pages = "1029--1030",

journal = "Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers",

issn = "0021-4922",

publisher = "Japan Society of Applied Physics",

number = "2 B",

}

TY - JOUR

T1 - Study of a super-resolution optical structure

T2 - Polycarbonate/ZnS-SiO2/ZnO/ZnS-SiO2/Ge2Sb2 Te5/ZnS-SiO2

AU - Lin, Wei Chih

AU - Kao, Tsung-Sheng

AU - Chang, Hsun Hao

AU - Lin, Yu Hsuan

AU - Fu, Yuan Hsin

AU - Wu, Chien Ting

AU - Chen, Kuei Hsien

AU - Tsai, Ding Ping

PY - 2003/2

Y1 - 2003/2

N2 - A new super-resolution near-field optical structure was demonstrated. The structure, polycarbonate/ZnS-SiO2(130 nm)/ZnO(15 nm)/ZnS-SiO2(30 nm)/Ge2Sb2Te5(15 nm)/ ZnS-SiO2(20 nm), has the ability in recording the small marks beyond the diffraction limit. At a readout power of 5 mW, the carrier to noise ratio (CNR) of more than 33 dB was measured for the recorded marks with the size of 100 nm by a digital versatile disc (DVD) tester. Transmission electron microscope (TEM) images of such structure displayed local orderly nanograins in 15 nm ZnO thin film. Ensemble effects of these ZnO nanostructures of the active layer are the key of the near-field super-resolution.

AB - A new super-resolution near-field optical structure was demonstrated. The structure, polycarbonate/ZnS-SiO2(130 nm)/ZnO(15 nm)/ZnS-SiO2(30 nm)/Ge2Sb2Te5(15 nm)/ ZnS-SiO2(20 nm), has the ability in recording the small marks beyond the diffraction limit. At a readout power of 5 mW, the carrier to noise ratio (CNR) of more than 33 dB was measured for the recorded marks with the size of 100 nm by a digital versatile disc (DVD) tester. Transmission electron microscope (TEM) images of such structure displayed local orderly nanograins in 15 nm ZnO thin film. Ensemble effects of these ZnO nanostructures of the active layer are the key of the near-field super-resolution.

KW - Near-field optics

KW - Super-resolution near-field structure (super-RENS)

KW - ZnO film

UR - http://www.scopus.com/inward/record.url?scp=0038060273&partnerID=8YFLogxK

U2 - 10.1143/JJAP.42.1029

DO - 10.1143/JJAP.42.1029

M3 - Article

AN - SCOPUS:0038060273

SN - 0021-4922

VL - 42

SP - 1029

EP - 1030

JO - Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

JF - Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

IS - 2 B

ER -

Study of a super-resolution optical structure: Polycarbonate/ZnS-SiO2/ZnO/ZnS-SiO2/Ge2Sb2 Te5/ZnS-SiO2

摘要

存取文件

其它文件與鏈接

指紋

引用此

Study of a super-resolution optical structure: Polycarbonate/ZnS-SiO₂/ZnO/ZnS-SiO₂/Ge₂Sb₂Te₅/ZnS-SiO₂