Structured Laser Beam Based on Ray Tracing Model

X. L. Zheng; Y. F. Chen

Structured Laser Beam Based on Ray Tracing Model

X. L. Zheng^*
, Y. F. Chen

^*此作品的通信作者

電子物理學系

研究成果: Paper › 同行評審

摘要

Using ray tracing models based on geometric optics, the equivalent cavity length difference caused by birefringent crystals can be accurately quantified, revealing the emergence of the Lissajous structured laser beam.

原文	English
出版狀態	Published - 2024
事件	2024 Advanced Solid State Lasers, ASSL 2024 - Osaka, 日本持續時間: 20 10月 2024 → 24 10月 2024

Conference

Conference	2024 Advanced Solid State Lasers, ASSL 2024
國家/地區	日本
城市	Osaka
期間	20/10/24 → 24/10/24

其它文件與鏈接

Link to publication in Scopus

引用此

@conference{d9575e82a77346ada48ac459121ddb92,

title = "Structured Laser Beam Based on Ray Tracing Model",

abstract = "Using ray tracing models based on geometric optics, the equivalent cavity length difference caused by birefringent crystals can be accurately quantified, revealing the emergence of the Lissajous structured laser beam.",

author = "Zheng, \{X. L.\} and Chen, \{Y. F.\}",

note = "Publisher Copyright: {\textcopyright} Optica Publishing Group 2024, {\textcopyright} 2024 The Author(s); 2024 Advanced Solid State Lasers, ASSL 2024 ; Conference date: 20-10-2024 Through 24-10-2024",

year = "2024",

language = "English",

}

TY - CONF

T1 - Structured Laser Beam Based on Ray Tracing Model

AU - Zheng, X. L.

AU - Chen, Y. F.

PY - 2024

Y1 - 2024

N2 - Using ray tracing models based on geometric optics, the equivalent cavity length difference caused by birefringent crystals can be accurately quantified, revealing the emergence of the Lissajous structured laser beam.

AB - Using ray tracing models based on geometric optics, the equivalent cavity length difference caused by birefringent crystals can be accurately quantified, revealing the emergence of the Lissajous structured laser beam.

UR - https://www.scopus.com/pages/publications/85215701399

M3 - Paper

AN - SCOPUS:85215701399

T2 - 2024 Advanced Solid State Lasers, ASSL 2024

Y2 - 20 October 2024 through 24 October 2024

ER -

Structured Laser Beam Based on Ray Tracing Model

摘要

Conference

其它文件與鏈接

指紋

引用此