Structural and optical properties of 1.3 μm wavelength InAsP/InP/InGaP strain-compensated multiple quantum well modulators grown by gas-source molecular beam epitaxy

Hao-Chung Kuo*, S. Thomas, T. U. Norton, B. G. Moser, G. E. Stillman, Chun-Hsiung Lin, Haydn Chen

*此作品的通信作者

研究成果: Article同行評審

3 引文 斯高帕斯(Scopus)

摘要

We present in this article a comparison of 1.3 μm InAs0.45P0.55/In0.81Ga0.19P strain-compensated multiple quantum well (SC-MQW) modulators with and without an InP insertion layer. Material quality was evaluated by cross-sectional transmission electron microscope analysis, x-ray rocking curves with dynamical simulations, and photoluminescence measurements. Devices were fabricated and device performance criteria such as contrast ratio (C.R.) and uniformity were also compared. It was found that higher C.R. and highly uniform InAsP/InGaP SC-MQW modulators can be achieved by inserting thin InP layers at the heterointerfaces between InAsP and InGaP.

原文English
頁(從 - 到)1377-1380
頁數4
期刊Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
16
發行號3
DOIs
出版狀態Published - 1998

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