@inproceedings{fd6f3ded0231415d90c2f8ec07ca9b3f,
title = "Statistical methodology to identify optimal placement of on-chip process monitors for predicting fmax",
abstract = "In previous literatures, many approaches use ring oscillators or other process monitors to correlate the chip's maximum operating frequency (Fmax). But none of them focus on the placement of these on-chip process monitors (OPMs) on a chip. The placement will greatly influence the accuracy of a prediction model. In this paper, we first propose a simulation framework to sample a chip's Fmax and it's OPM result. These samples are used to develop our methodology of OPM placement and to verify the effectiveness of an OPM placement. Then, a model-fitting framework is presented to correlate the OPMs' result to chip's Fmax. Finally, we propose a methodology to idenify optimal placement of OPM for predicting Fmax. The experiments demonstrate the effectiveness of our methodology in both simulation and silicon data.",
author = "Mu, {Szu Pang} and Chang, {Wen Hsiang} and Chia-Tso Chao and Wang, {Yi Ming} and Chang, {Ming Tung} and Tsai, {Min Hsiu}",
note = "Publisher Copyright: {\textcopyright} 2016 ACM.; 35th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2016 ; Conference date: 07-11-2016 Through 10-11-2016",
year = "2016",
month = nov,
day = "7",
doi = "10.1145/2966986.2967076",
language = "English",
series = "IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2016 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2016",
address = "美國",
}