Statistical Framework and Built-In Self-Speed-Binning System for Speed Binning Using On-Chip Ring Oscillators

Keyphrases

• On chip 100%
• Ring Oscillator 100%
• Statistical Framework 100%
• Speed Binning 100%
• Functional Test 33%
• Autotest 33%
• Equipment Software 33%
• Test Time Reduction 33%
• System-on-chip 16%
• Learning Model 16%
• Third Order 16%
• Fourth Order 16%
• Operating Speed 16%
• Model Fitting 16%
• Speed Model 16%
• Built-in Circuit 16%
• Mobile Application System 16%
• Binning Method 16%

Engineering

• Test Time 100%
• Test Equipment 100%
• Functional Test 100%
• Oscillator 100%
• System-on-Chip 50%
• Fourth Order 50%
• Operating Speed 50%