Statistical electro-thermal analysis with high compatibility of leakage power models

Huai Chung Chang; Pei Yu Huang; Ting Jung Li; Yu-Min Lee

doi:10.1109/SOCC.2010.5784747

Statistical electro-thermal analysis with high compatibility of leakage power models

Huai Chung Chang^*, Pei Yu Huang, Ting Jung Li, Yu-Min Lee

^*此作品的通信作者

電機工程學系

研究成果: Conference contribution › 同行評審

3 引文斯高帕斯（Scopus）

摘要

In this work, a statistical electro-thermal analyzer with high compatibility of power model is developed. The developed analyzer takes both the easily implementing advantage of Monte Carlo method and the fast convergent advantage of stochastic analysis method to effectively solve the statistical electro-thermal problem. Experimental results indicate that the developed electro-thermal analyzer can be orders of magnitude faster than the Monte Carlo method under the same accuracy level. The computational time is only 1.16 seconds for a design with over one million gates, and the maximum errors are only 0.34% and 1.84%, compared with the Monte Carlo method, for estimating the mean and the standard deviation profiles of full-chip temperature distribution, respectively.

原文	English
主出版物標題	Proceedings - IEEE International SOC Conference, SOCC 2010
頁面	139-144
頁數	6
DOIs	https://doi.org/10.1109/SOCC.2010.5784747
出版狀態	Published - 1 12月 2010
事件	23rd IEEE International SOC Conference, SOCC 2010 - Las Vegas, NV, United States 持續時間: 27 9月 2010 → 29 9月 2010

出版系列

名字	Proceedings - IEEE International SOC Conference, SOCC 2010

Conference

Conference	23rd IEEE International SOC Conference, SOCC 2010
國家/地區	United States
城市	Las Vegas, NV
期間	27/09/10 → 29/09/10

存取文件

10.1109/SOCC.2010.5784747

其它文件與鏈接

Link to publication in Scopus

引用此

@inproceedings{ecdc972f6e4f4b21a387a1b13c38fdb3,

title = "Statistical electro-thermal analysis with high compatibility of leakage power models",

abstract = "In this work, a statistical electro-thermal analyzer with high compatibility of power model is developed. The developed analyzer takes both the easily implementing advantage of Monte Carlo method and the fast convergent advantage of stochastic analysis method to effectively solve the statistical electro-thermal problem. Experimental results indicate that the developed electro-thermal analyzer can be orders of magnitude faster than the Monte Carlo method under the same accuracy level. The computational time is only 1.16 seconds for a design with over one million gates, and the maximum errors are only 0.34% and 1.84%, compared with the Monte Carlo method, for estimating the mean and the standard deviation profiles of full-chip temperature distribution, respectively.",

author = "Chang, {Huai Chung} and Huang, {Pei Yu} and Li, {Ting Jung} and Yu-Min Lee",

year = "2010",

month = dec,

day = "1",

doi = "10.1109/SOCC.2010.5784747",

language = "English",

isbn = "9781424466832",

series = "Proceedings - IEEE International SOC Conference, SOCC 2010",

pages = "139--144",

booktitle = "Proceedings - IEEE International SOC Conference, SOCC 2010",

note = "23rd IEEE International SOC Conference, SOCC 2010 ; Conference date: 27-09-2010 Through 29-09-2010",

}

Chang, HC, Huang, PY, Li, TJ & Lee, Y-M 2010, Statistical electro-thermal analysis with high compatibility of leakage power models. 於 Proceedings - IEEE International SOC Conference, SOCC 2010., 5784747, Proceedings - IEEE International SOC Conference, SOCC 2010, 頁 139-144, 23rd IEEE International SOC Conference, SOCC 2010, Las Vegas, NV, United States, 27/09/10. https://doi.org/10.1109/SOCC.2010.5784747

TY - GEN

T1 - Statistical electro-thermal analysis with high compatibility of leakage power models

AU - Chang, Huai Chung

AU - Huang, Pei Yu

AU - Li, Ting Jung

AU - Lee, Yu-Min

PY - 2010/12/1

Y1 - 2010/12/1

N2 - In this work, a statistical electro-thermal analyzer with high compatibility of power model is developed. The developed analyzer takes both the easily implementing advantage of Monte Carlo method and the fast convergent advantage of stochastic analysis method to effectively solve the statistical electro-thermal problem. Experimental results indicate that the developed electro-thermal analyzer can be orders of magnitude faster than the Monte Carlo method under the same accuracy level. The computational time is only 1.16 seconds for a design with over one million gates, and the maximum errors are only 0.34% and 1.84%, compared with the Monte Carlo method, for estimating the mean and the standard deviation profiles of full-chip temperature distribution, respectively.

AB - In this work, a statistical electro-thermal analyzer with high compatibility of power model is developed. The developed analyzer takes both the easily implementing advantage of Monte Carlo method and the fast convergent advantage of stochastic analysis method to effectively solve the statistical electro-thermal problem. Experimental results indicate that the developed electro-thermal analyzer can be orders of magnitude faster than the Monte Carlo method under the same accuracy level. The computational time is only 1.16 seconds for a design with over one million gates, and the maximum errors are only 0.34% and 1.84%, compared with the Monte Carlo method, for estimating the mean and the standard deviation profiles of full-chip temperature distribution, respectively.

UR - http://www.scopus.com/inward/record.url?scp=79960707312&partnerID=8YFLogxK

U2 - 10.1109/SOCC.2010.5784747

DO - 10.1109/SOCC.2010.5784747

M3 - Conference contribution

AN - SCOPUS:79960707312

SN - 9781424466832

T3 - Proceedings - IEEE International SOC Conference, SOCC 2010

SP - 139

EP - 144

BT - Proceedings - IEEE International SOC Conference, SOCC 2010

T2 - 23rd IEEE International SOC Conference, SOCC 2010

Y2 - 27 September 2010 through 29 September 2010

ER -

Statistical electro-thermal analysis with high compatibility of leakage power models

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Conference

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