SPICE simulation model for field emission triode

Chih Wen Lu; Chung Len Lee; J. M. Huang

doi:10.1109/IVMC.1996.601774

SPICE simulation model for field emission triode

Chih Wen Lu^*, Chung Len Lee, J. M. Huang

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照明與能源光電研究所

研究成果: Paper › 同行評審

2 引文斯高帕斯（Scopus）

摘要

In this work, a simple but accurate circuit model, which can be incorporated into circuit simulation programs such as SPICE, for field emission triode (FET) is developed. The model is based on the Fowler-Nordheim (F-N) J-E relationship but takes into account the charge distribution on the surface of the tip of the device. A procedure is also developed to extract the parameters of the model.

原文	English
頁面	62-66
頁數	5
DOIs	https://doi.org/10.1109/IVMC.1996.601774
出版狀態	Published - 1996
事件	Proceedings of the 1996 9th International Vacuum Microelectronics Conference, IVMC - St.Petersburg, Russia 持續時間: 7 7月 1996 → 12 7月 1996

Conference

Conference	Proceedings of the 1996 9th International Vacuum Microelectronics Conference, IVMC
城市	St.Petersburg, Russia
期間	7/07/96 → 12/07/96

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10.1109/IVMC.1996.601774

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title = "SPICE simulation model for field emission triode",

abstract = "In this work, a simple but accurate circuit model, which can be incorporated into circuit simulation programs such as SPICE, for field emission triode (FET) is developed. The model is based on the Fowler-Nordheim (F-N) J-E relationship but takes into account the charge distribution on the surface of the tip of the device. A procedure is also developed to extract the parameters of the model.",

author = "Lu, {Chih Wen} and Lee, {Chung Len} and Huang, {J. M.}",

year = "1996",

doi = "10.1109/IVMC.1996.601774",

language = "English",

pages = "62--66",

note = "Proceedings of the 1996 9th International Vacuum Microelectronics Conference, IVMC ; Conference date: 07-07-1996 Through 12-07-1996",

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AU - Lu, Chih Wen

AU - Lee, Chung Len

AU - Huang, J. M.

PY - 1996

Y1 - 1996

N2 - In this work, a simple but accurate circuit model, which can be incorporated into circuit simulation programs such as SPICE, for field emission triode (FET) is developed. The model is based on the Fowler-Nordheim (F-N) J-E relationship but takes into account the charge distribution on the surface of the tip of the device. A procedure is also developed to extract the parameters of the model.

AB - In this work, a simple but accurate circuit model, which can be incorporated into circuit simulation programs such as SPICE, for field emission triode (FET) is developed. The model is based on the Fowler-Nordheim (F-N) J-E relationship but takes into account the charge distribution on the surface of the tip of the device. A procedure is also developed to extract the parameters of the model.

UR - http://www.scopus.com/inward/record.url?scp=0030349614&partnerID=8YFLogxK

U2 - 10.1109/IVMC.1996.601774

DO - 10.1109/IVMC.1996.601774

M3 - Paper

AN - SCOPUS:0030349614

SP - 62

EP - 66

T2 - Proceedings of the 1996 9th International Vacuum Microelectronics Conference, IVMC

Y2 - 7 July 1996 through 12 July 1996

ER -

SPICE simulation model for field emission triode

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Conference

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