Spectral analysis of noise sources in InGaN light emitting diodes

Gray Lin*, Kuan Lin Su, Shih Tsun Yang, Tzung Te Chen, Chiu Ling Chen

*此作品的通信作者

    研究成果: Conference contribution同行評審

    摘要

    Noise characterization of InGaN light emitting diodes shows that the exponent in current dependence of low-frequency flicker noise amplitude and the corner frequency in highfrequency generation-recombination noise spectra are two possible indicators for device reliability.

    原文English
    主出版物標題CLEO
    主出版物子標題2011 - Laser Science to Photonic Applications
    發行者IEEE
    ISBN(電子)9781557529114
    ISBN(列印)9781457712234
    DOIs
    出版狀態Published - 1 5月 2011
    事件2011 Conference on Lasers and Electro-Optics, CLEO 2011 - Baltimore, MD, United States
    持續時間: 1 5月 20116 5月 2011

    出版系列

    名字2011 Conference on Lasers and Electro-Optics: Laser Science to Photonic Applications, CLEO 2011

    Conference

    Conference2011 Conference on Lasers and Electro-Optics, CLEO 2011
    國家/地區United States
    城市Baltimore, MD
    期間1/05/116/05/11

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