Space- and time-resolved mapping of ionic dynamic and electroresistive phenomena in lateral devices

Evgheni Strelcov*, Stephen Jesse, Yen Lin Huang, Yung Chun Teng, Ivan I. Kravchenko, Ying Hao Chu, Sergei V. Kalinin

*此作品的通信作者

研究成果: Article同行評審

42 引文 斯高帕斯(Scopus)

摘要

A scanning probe microscopy-based technique for probing local ionic and electronic transport and their dynamic behavior on the 10 ms to 10 s scale is presented. The time-resolved Kelvin probe force microscopy (tr-KPFM) allows mapping of surface potential in both space and time domains, visualizing electronic and ionic charge dynamics and separating underlying processes based on their time responses. Here, tr-KPFM is employed to explore the interplay of the adsorbed surface ions and bulk oxygen vacancies and their role in the resistive switching in a Ca-substituted bismuth ferrite thin film.

原文English
頁(從 - 到)6806-6815
頁數10
期刊ACS Nano
7
發行號8
DOIs
出版狀態Published - 9 7月 2013

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