摘要
A scanning probe microscopy-based technique for probing local ionic and electronic transport and their dynamic behavior on the 10 ms to 10 s scale is presented. The time-resolved Kelvin probe force microscopy (tr-KPFM) allows mapping of surface potential in both space and time domains, visualizing electronic and ionic charge dynamics and separating underlying processes based on their time responses. Here, tr-KPFM is employed to explore the interplay of the adsorbed surface ions and bulk oxygen vacancies and their role in the resistive switching in a Ca-substituted bismuth ferrite thin film.
原文 | English |
---|---|
頁(從 - 到) | 6806-6815 |
頁數 | 10 |
期刊 | ACS Nano |
卷 | 7 |
發行號 | 8 |
DOIs | |
出版狀態 | Published - 9 7月 2013 |