Small signal model and RF performance analysis of InAs/GaSb hetero-junction tunneling field effect transistor

Sankalp Kumar Singh, Pragyey Kumar Kaushik, Ramesh Kumar Kakkerla, Ankur Gupta, Deepak Anandan, Venkatesan Nagarajan, Hung-Wei Yu, Edward Yi Chang*

*此作品的通信作者

研究成果: Article同行評審

摘要

This work presents a comprehensive study of small-signal parameters based on radio frequency (RF) data of a heterojunction tunnel field effect transistor (HJ-TFET). The TFET device shows excellent small-signal analog and RF performance. Numerical device simulations of the optimized HJ-TFET shows ION/IOFF ratio of ∼6 orders of magnitude. It is found that gate voltage dependency of HJ-TFET on the intrinsic parameters obtained from the non-quasi static (NQS) model differ from the conventional MOSFET due to band to band tunneling mechanism and inversion layer formation in the device. Based on this mechanism, the high frequency analog and RF performance of HJ-TFET were investigated using TCADand modeled usingNQS model, which was verified upto 100 GHz. The modeling results showed excellent agreement with the simulated small-signal parameters at multiple drain voltages (Vd). f

原文English
文章編號035004
頁(從 - 到)1-11
頁數11
期刊Engineering Research Express
2
發行號3
DOIs
出版狀態Published - 9月 2020

指紋

深入研究「Small signal model and RF performance analysis of InAs/GaSb hetero-junction tunneling field effect transistor」主題。共同形成了獨特的指紋。

引用此