Simultaneous phase retardation and optic axis measurements of A- and C-plates

Yung Hsun Wu; Yi-Hsin Lin; Hongwen Ren; Shin Tson Wu

doi:10.1889/1.2433615

Simultaneous phase retardation and optic axis measurements of A- and C-plates

Yung Hsun Wu^*
, Yi-Hsin Lin
, Hongwen Ren
, Shin Tson Wu

^*此作品的通信作者

光電工程學系

研究成果: Conference article › 同行評審

摘要

We demonstrate a new method for simultaneously measuring the phase retardation and optic axis of a compensation film by using an axially-symmetric sheared polymer network liquid crystal (AS-SPNLC). With overlaying a tested compensation film with a calibrated AS-SPNLC cell between crossed polarizers, the optic axis and phase retardation value of the compensation film can be determined. This method is applicable to both A- and C-plate phase compensation films.

原文	English
頁（從 - 到）	732-735
頁數	4
期刊	Digest of Technical Papers - SID International Symposium
卷	37
發行號	1
DOIs	https://doi.org/10.1889/1.2433615
出版狀態	Published - 1 12月 2006
事件	44th International Symposium, Seminar, and Exhibition, SID 2006 - San Francisco, CA, 美國持續時間: 4 6月 2006 → 9 6月 2006

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10.1889/1.2433615

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title = "Simultaneous phase retardation and optic axis measurements of A- and C-plates",

abstract = "We demonstrate a new method for simultaneously measuring the phase retardation and optic axis of a compensation film by using an axially-symmetric sheared polymer network liquid crystal (AS-SPNLC). With overlaying a tested compensation film with a calibrated AS-SPNLC cell between crossed polarizers, the optic axis and phase retardation value of the compensation film can be determined. This method is applicable to both A- and C-plate phase compensation films.",

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AU - Wu, Yung Hsun

AU - Lin, Yi-Hsin

AU - Ren, Hongwen

AU - Wu, Shin Tson

PY - 2006/12/1

Y1 - 2006/12/1

N2 - We demonstrate a new method for simultaneously measuring the phase retardation and optic axis of a compensation film by using an axially-symmetric sheared polymer network liquid crystal (AS-SPNLC). With overlaying a tested compensation film with a calibrated AS-SPNLC cell between crossed polarizers, the optic axis and phase retardation value of the compensation film can be determined. This method is applicable to both A- and C-plate phase compensation films.

AB - We demonstrate a new method for simultaneously measuring the phase retardation and optic axis of a compensation film by using an axially-symmetric sheared polymer network liquid crystal (AS-SPNLC). With overlaying a tested compensation film with a calibrated AS-SPNLC cell between crossed polarizers, the optic axis and phase retardation value of the compensation film can be determined. This method is applicable to both A- and C-plate phase compensation films.

UR - https://www.scopus.com/pages/publications/34547516887

U2 - 10.1889/1.2433615

DO - 10.1889/1.2433615

M3 - Conference article

AN - SCOPUS:34547516887

SN - 0097-966X

VL - 37

SP - 732

EP - 735

JO - Digest of Technical Papers - SID International Symposium

JF - Digest of Technical Papers - SID International Symposium

IS - 1

T2 - 44th International Symposium, Seminar, and Exhibition, SID 2006

Y2 - 4 June 2006 through 9 June 2006

ER -

Simultaneous phase retardation and optic axis measurements of A- and C-plates

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