TY - GEN
T1 - Simultaneous optimization for low dropout regulator and its error amplifier with process variation
AU - Chen, Yen Lung
AU - Chu, Guan Ming
AU - Lien, Ying Chi
AU - Lee, Ching Mao
AU - Liu, Chien-Nan
PY - 2014/1/1
Y1 - 2014/1/1
N2 - Due to its low power, small ripple and low noise properties, low-dropout regulators (LDO) are often used in on-chip applications. However, there are few design automation works focusing on this important circuit. In this paper, an automatic optimization process is proposed to generate the optimal sizing of low dropout regulators. The devices in the LDO circuit and its error amplifier are both considered in the optimization process for reducing the overall circuit cost. The process variation effects are also considered in this work to guarantee the circuit performance after manufactured. As demonstrated in the experiments, the proposed approach successfully solves the unreachable specification in previous work and significantly improves the design yield of the generated circuits.
AB - Due to its low power, small ripple and low noise properties, low-dropout regulators (LDO) are often used in on-chip applications. However, there are few design automation works focusing on this important circuit. In this paper, an automatic optimization process is proposed to generate the optimal sizing of low dropout regulators. The devices in the LDO circuit and its error amplifier are both considered in the optimization process for reducing the overall circuit cost. The process variation effects are also considered in this work to guarantee the circuit performance after manufactured. As demonstrated in the experiments, the proposed approach successfully solves the unreachable specification in previous work and significantly improves the design yield of the generated circuits.
UR - http://www.scopus.com/inward/record.url?scp=84904016203&partnerID=8YFLogxK
U2 - 10.1109/VLSI-DAT.2014.6834870
DO - 10.1109/VLSI-DAT.2014.6834870
M3 - Conference contribution
AN - SCOPUS:84904016203
SN - 9781479927760
T3 - Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2014
BT - Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2014
PB - IEEE Computer Society
T2 - 2014 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2014
Y2 - 28 April 2014 through 30 April 2014
ER -