Simulating total-dose radiation effects on circuit behavior

Robert Tu*, Gary Lum, Paolo Pavan, Ping Ko, Chen-Ming Hu

*此作品的通信作者

研究成果: Conference contribution同行評審

4 引文 斯高帕斯(Scopus)

摘要

Using RAD, a new module of Berkeley Reliability Tools (BERT), as a tool, users can design circuits to be radiation hard and characterize circuit behavior in environments where radiation is present. Previous simulators could not provide circuit output waveforms after irradiation because it was difficult to simulate the effect of radiation on a circuit in operation (AC bias condition) and because radiation affected MOSFETs of different processes in different ways. We have dealt with these problems and for the first time, successfully provided `SPICE-like' simulation results.

原文English
主出版物標題Annual Proceedings - Reliability Physics (Symposium)
發行者Publ by IEEE
頁面344-350
頁數7
ISBN(列印)0780313577
DOIs
出版狀態Published - 1 一月 1994
事件Proceedings of the 32nd Annual International Reliability Physics Proceedings - San Jose, CA, USA
持續時間: 12 四月 199414 四月 1994

出版系列

名字Annual Proceedings - Reliability Physics (Symposium)
ISSN(列印)0099-9512

Conference

ConferenceProceedings of the 32nd Annual International Reliability Physics Proceedings
城市San Jose, CA, USA
期間12/04/9414/04/94

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