摘要
Construction of a tapping-mode tuning fork with a short fiber probe as the force sensing element for near-field scanning optical microscopy is reported. This type of near-field scanning optical microscopy provides stable and high Q factor at the tapping frequency of the tuning fork, and thus gives high quality NSOM and AFM images of samples.We present results obtained by using the short tip tapping-mode tuning fork near-field scanning optical microscopy measurements performed on a single mode telecommunication optical fiber and a silica based buried channel waveguide.
原文 | English |
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頁(從 - 到) | 146-150 |
頁數 | 5 |
期刊 | Proceedings of SPIE - The International Society for Optical Engineering |
卷 | 4923 |
DOIs | |
出版狀態 | Published - 5 9月 2002 |
事件 | Nano-Optics and Nano-Structures 2002 - Shanghai, 中國 持續時間: 14 10月 2002 → 18 10月 2002 |