Short-diode like diffusion capacitance of organic light emission devices

Mei Na Tsai, T. C. Chang*, Po-Tsun Liu, Chung Wen Ko, Che Jen Chen, Kang Mien Lo

*此作品的通信作者

研究成果: Conference article同行評審

30 引文 斯高帕斯(Scopus)

摘要

A prototypical organic light-emitting diode (OLED), anode/organic layers/cathode, is investigated via bias-dependent capacitance measurement of two-layer (HTL/ETL) and four-layer (HIL/HTL/EML/ETL) structure at low frequency. As applied voltage was larger than the built-in voltage, the capacitance is augmented by diffusion capacitance with increasing the forward bias voltage. In contrast, the capacitance dropped quickly. It is possibly due to the voltage drop in the bulk and conductivity modulation occurred by high carrier concentration for much higher forward biases, eventually showing negative for two-layer OLEDs. We infer that the phenomena were resulted from the extremely thin OLED structure, just like short p-n semiconductor diodes. This diffusion capacitance exhibiting like short-diode behavior also can be measured in C-V curves of single-layer structure OLED.

原文English
頁(從 - 到)244-248
頁數5
期刊Thin Solid Films
498
發行號1-2
DOIs
出版狀態Published - 1 3月 2006
事件Proceedings of the Third Asian Conference on Chemical Vapor Deposition (Third Asian-CVD), Third Asian CVD -
持續時間: 12 11月 200414 11月 2004

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