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Self-Reset Transient Detection Circuit for On-Chip Protection Against System-Level Electrical-Transient Disturbance
Xiao Rui Kang
,
Ming-Dou Ker
*
*
此作品的通信作者
電子研究所
神經調控醫療電子系統研究中心
研究成果
:
Article
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同行評審
4
引文 斯高帕斯（Scopus）
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Keyphrases
On chip
100%
System Level
100%
Transient Disturbance
100%
Transient Detection Circuit
100%
Electrical Transient
100%
Chip Protection
100%
Self-reset
100%
Complementary Metal Oxide Semiconductor
40%
Microelectronics
40%
Stable State
20%
Recovery Time
20%
Firmware
20%
Experiment Results
20%
Electrostatic Discharge
20%
SPICE Model
20%
Semiconductor Process
20%
Circuit Performance
20%
Transient Test
20%
Silicon chip
20%
Electrical Fast Transient
20%
Detection Circuit
20%
Testing Conditions
20%
System Recovery
20%
Semiconductor Integrated Circuits
20%
Microelectronic Systems
20%
Electromagnetic Susceptibility
20%
Disturbance Event
20%
On-chip Solution
20%
Immunity Level
20%
Reset Time
20%
Abnormal State
20%
Engineering
Transients
100%
Electrical Level
100%
Microelectronics
42%
Recovery Time
14%
Fast Transient
14%
Electrostatic Discharge
14%
Complementary Metal-Oxide-Semiconductor
14%
CMOS Integrated Circuits
14%
Circuit Performance
14%
Initial State
14%
Testing Condition
14%
Stable State
14%