Self-matched ESD cell in CMOS technology for 60-GHz broadband RF applications

Chun Yu Lin; Li Wei Chu; Ming-Dou Ker; Tse Hua Lu; Ping Fang Hung; Hsiao Chun Li

doi:10.1109/RFIC.2010.5477291

Self-matched ESD cell in CMOS technology for 60-GHz broadband RF applications

Chun Yu Lin^*, Li Wei Chu, Ming-Dou Ker, Tse Hua Lu, Ping Fang Hung, Hsiao Chun Li

^*此作品的通信作者

研究成果: Conference contribution › 同行評審

15 引文斯高帕斯（Scopus）

摘要

A self-matched ESD cell library has been implemented in a commercial sub-100nm CMOS process for 60-GHz broadband RF applications. This ESD cell library has reached the 50-Ω input/output matching to reduce the design complexity for RF circuit designer and to provide suitable electrostatic discharge (ESD) protection. Experimental results of this ESD cell library have successfully verified the ESD robustness and the RF characteristics in the 60-GHz frequency band. This self-matched ESD cell library is easily to be used for ESD protection design in the 60-GHz broadband RF applications.

原文	English
主出版物標題	Proceedings of the 2010 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2010
頁面	573-576
頁數	4
DOIs	https://doi.org/10.1109/RFIC.2010.5477291
出版狀態	Published - 16 7月 2010
事件	2010 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2010 - Anaheim, CA, United States 持續時間: 23 5月 2010 → 25 5月 2010

出版系列

名字	Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium
ISSN（列印）	1529-2517

Conference

Conference	2010 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2010
國家/地區	United States
城市	Anaheim, CA
期間	23/05/10 → 25/05/10

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10.1109/RFIC.2010.5477291

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Link to publication in Scopus

引用此

Lin, C. Y., Chu, L. W., Ker, M.-D., Lu, T. H., Hung, P. F., & Li, H. C. (2010). Self-matched ESD cell in CMOS technology for 60-GHz broadband RF applications. 於 Proceedings of the 2010 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2010 (頁 573-576). 文章 10.1109/RFIC.2010.5477291 (Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium). https://doi.org/10.1109/RFIC.2010.5477291

@inproceedings{fb2e3c6b1b744169a64433d0b8649f6f,

title = "Self-matched ESD cell in CMOS technology for 60-GHz broadband RF applications",

abstract = "A self-matched ESD cell library has been implemented in a commercial sub-100nm CMOS process for 60-GHz broadband RF applications. This ESD cell library has reached the 50-Ω input/output matching to reduce the design complexity for RF circuit designer and to provide suitable electrostatic discharge (ESD) protection. Experimental results of this ESD cell library have successfully verified the ESD robustness and the RF characteristics in the 60-GHz frequency band. This self-matched ESD cell library is easily to be used for ESD protection design in the 60-GHz broadband RF applications.",

keywords = "60 GHz, Broadband, Electrostatic discharge (ESD), ESD cell, V-band",

author = "Lin, {Chun Yu} and Chu, {Li Wei} and Ming-Dou Ker and Lu, {Tse Hua} and Hung, {Ping Fang} and Li, {Hsiao Chun}",

year = "2010",

month = jul,

day = "16",

doi = "10.1109/RFIC.2010.5477291",

language = "English",

isbn = "9781424462421",

series = "Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium",

pages = "573--576",

booktitle = "Proceedings of the 2010 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2010",

note = "2010 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2010 ; Conference date: 23-05-2010 Through 25-05-2010",

}

Lin, CY, Chu, LW, Ker, M-D, Lu, TH, Hung, PF & Li, HC 2010, Self-matched ESD cell in CMOS technology for 60-GHz broadband RF applications. 於 Proceedings of the 2010 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2010., 10.1109/RFIC.2010.5477291, Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium, 頁 573-576, 2010 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2010, Anaheim, CA, United States, 23/05/10. https://doi.org/10.1109/RFIC.2010.5477291

Self-matched ESD cell in CMOS technology for 60-GHz broadband RF applications. / Lin, Chun Yu; Chu, Li Wei; Ker, Ming-Dou 等.
Proceedings of the 2010 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2010. 2010. p. 573-576 10.1109/RFIC.2010.5477291 (Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium).

研究成果: Conference contribution › 同行評審

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AU - Lin, Chun Yu

AU - Chu, Li Wei

AU - Ker, Ming-Dou

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AU - Li, Hsiao Chun

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AB - A self-matched ESD cell library has been implemented in a commercial sub-100nm CMOS process for 60-GHz broadband RF applications. This ESD cell library has reached the 50-Ω input/output matching to reduce the design complexity for RF circuit designer and to provide suitable electrostatic discharge (ESD) protection. Experimental results of this ESD cell library have successfully verified the ESD robustness and the RF characteristics in the 60-GHz frequency band. This self-matched ESD cell library is easily to be used for ESD protection design in the 60-GHz broadband RF applications.

KW - 60 GHz

KW - Broadband

KW - Electrostatic discharge (ESD)

KW - ESD cell

KW - V-band

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Self-matched ESD cell in CMOS technology for 60-GHz broadband RF applications

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