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See-through Ga2O3 solar-blind photodetectors for use in harsh environments

  • Tzu Chiao Wei
  • , Dung Sheng Tsai
  • , Parvaneh Ravadgar
  • , Jr Jian Ke
  • , Meng Lin Tsai
  • , Der-Hsien Lien
  • , Chiung Yi Huang
  • , Ray-Hua Horng
  • , Jr Hau He

研究成果: Article同行評審

98 引文 斯高帕斯(Scopus)

摘要

This paper demonstrates the higherature operation of fully transparent solar-blind deep ultraviolet (DUV) metal-semiconductor-metal (MSM) photodetectors (PDs) employing β-Ga2O3 thin films with transmittance up to 80% from 400 to 900 nm without image blurring. Even at a bias up to 200 V, the β-Ga2O3 MSM PDs show dark current as low as ∼1 nA. The dark current of β-Ga2O 3 MSM PDs under significantly different oxygen concentration in the ambiences are similar, indicating that the high inertness to surface effect. Moreover, the responsivity and the working temperature of β-Ga 2O3 MSM PDs at 10 V bias are 0.32 mA/W and as high as 700 K, respectively. Full recovery after 700-K operation demonstrates reliability and robustness of β-Ga2O3 PDs. The superior see-through features, electrical tolerance, inertness to surface effect, thermal stability, and solar-blind DUV photoresponse of β-Ga2O 3 MSM PDs support the use in next-generation DUV PDs applications under harsh environments.

原文English
文章編號6809845
期刊IEEE Journal of Selected Topics in Quantum Electronics
20
發行號6
DOIs
出版狀態Published - 2 5月 2014

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