Secondary ion mass spectrometry to verify the implantation of magnetic ions in nanodiamonds

Bo-Rong Lin, Chiung Chiu Wang, Chien-Hsu Chen, Srinivasu Kunuku, Tung-Yuan Hsiao, Hung-Kai Yu, Yu Jen Chang, Li Chuan Liao, Chun-Hsiang Chang, Fang-Hsin Chen, Huan Niu, Chien-Ping Lee

研究成果: Article同行評審

1 引文 斯高帕斯(Scopus)

摘要

Ion implantation is used to create nanodiamonds (NDs) with embedded magnetic ions for use in a wide range of biological and medical applications; however, the effectiveness of this process depends heavily on separating magnetic NDs from nonmagnetic ones. In this study, we use secondary ion mass spectrometry to verify the implantation of magnetic ions in NDs and the success of separation. When applied to a series of NDs with embedded iron or manganese ions, the sorting tool used in this study proved highly effective in selecting magnetic NDs. Besides, multienergy ion implantation and precise thickness control of NDs coating on the silicon wafer were suggested to improve this technology. Published under license by AIP Publishing.
原文English
文章編號175301
期刊Journal of Applied Physics
126
發行號17
DOIs
出版狀態Published - 5 11月 2019

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