SDPTA: Soft-Delay-aware Pattern-based Timing Analysis and Its Path-Fixing Mechanism

Gary K.C. Huang, Dave Y.W. Lin, John Z.L. Tang, Charles H.P. Wen

研究成果: Conference contribution同行評審

1 引文 斯高帕斯(Scopus)

摘要

In modern VLSI design flow, timing analysis is crucial for verifying whether a circuit design can operate without errors. Soft-delay effect (SDE), which is a kind of degraded soft error, will make system failed though the circuit has passed the typical timing analysis. Therefore, we propose a soft-delay-aware timing analysis which takes SDE into consideration. Additionally, a path-fixing mechanism is also proposed to fix up the violated paths automatically. Experimental results show that only 1.05% area budget is required averagely that all violated paths can be fixed up. In summary, SDPTA and the path-fixing mechanism are capable of reducing SDE to general circuits without other manual effort.

原文English
主出版物標題Proceedings - 2020 IEEE 29th Asian Test Symposium, ATS 2020
發行者IEEE Computer Society
ISBN(電子)9781728174679
DOIs
出版狀態Published - 23 11月 2020
事件29th IEEE Asian Test Symposium, ATS 2020 - Penang, Malaysia
持續時間: 22 11月 202025 11月 2020

出版系列

名字Proceedings of the Asian Test Symposium
2020-November
ISSN(列印)1081-7735

Conference

Conference29th IEEE Asian Test Symposium, ATS 2020
國家/地區Malaysia
城市Penang
期間22/11/2025/11/20

指紋

深入研究「SDPTA: Soft-Delay-aware Pattern-based Timing Analysis and Its Path-Fixing Mechanism」主題。共同形成了獨特的指紋。

引用此