Robust terahertz polarizers with high transmittance at selected frequencies through Si wafer bonding technologies

Ting Yang Yu, Nai Chen Chi, Hsin Cheng Tsai, Shiang Yu Wang, Chih-Wei Luo, Kuan-Neng Chen*

*此作品的通信作者

研究成果: Article同行評審

9 引文 斯高帕斯(Scopus)

摘要

Terahertz (THz) polarizers with robust structure and high transmittance are demonstrated using 3D-integrated circuit (IC) technologies. A Cu wire-grid polarizer is sealed and well protected by Si-bonded wafers through a low-temperature eutectic bonding method. Deep reactive-ion etching is used to fabricate the anti-reflection (AR) layers on outward surfaces of bonded wafers. The extinction ratio and transmittance of polarizers are between 20 dB and 33 dB, and 13 dB and 27 dB for 10 μm and 20 μm pitch wire-grids, respectively, and 100% at central frequency, depending on frequency and AR layer thickness. The process of polarizer fabrication is simple from mature semiconductor manufacturing techniques that lead to high yield, low cost, and potential for THz applications.

原文English
頁(從 - 到)4917-4920
頁數4
期刊Optics Letters
42
發行號23
DOIs
出版狀態Published - 1 12月 2017

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