摘要
Inductive and capacitive coupling effects for high-speed global interconnects are studied via simulation. The impact of inductive coupling on delay and noise is found to be comparable to capacitive effects in high-speed buses. The results indicate that current-return paths are not strictly bounded by wide VDD/GND lines, so that inductive coupling is only partially eliminated by using shield wires. Shielding strategies for noise- and delay-sensitive nets is proposed, considering worst-case switching patterns.
原文 | English |
---|---|
頁(從 - 到) | 731-733 |
頁數 | 3 |
期刊 | Technical Digest - International Electron Devices Meeting |
DOIs | |
出版狀態 | Published - 1 12月 2000 |
事件 | 2000 IEEE International Electron Devices Meeting - San Francisco, CA, 美國 持續時間: 10 12月 2000 → 13 12月 2000 |