@article{17bf693ea8cc4a3094e689ea059d19ea,
title = "RHEED intensity oscillations in homoepitaxial growth of SrTiO3 films",
abstract = "The amplitude and periodicity of the reflection high-energy electron diffraction (RHEED) oscillations displayed strong temperature dependence in homoepitaxy of SrTiO3(STO) films. Combining with the AFM observations, the results suggest that the oscillations are not directly related to the layer-by-layer growth.",
keywords = "Atomic force microscopy, Epitaxial growth, Homoepitaxial SrTiO3 thin film, RHEED",
author = "Lee, {J. Y.} and Jenh-Yih Juang and Ou, {J. H.} and Yung-Fu Chen and Kaung-Hsiung Wu and Uen, {T. M.} and Gou, {Y. S.}",
year = "2000",
month = jul,
doi = "10.1016/S0921-4526(99)02981-6",
language = "English",
volume = "284-288",
pages = "2099--2100",
journal = "Physica B: Condensed Matter",
issn = "0921-4526",
publisher = "Elsevier B.V.",
number = "PART II",
}