RF noise shielding method and modelling for nanoscale MOSFET

Jyh-Chyurn Guo, Yi Min Lin, Yi Hsiu Tsai

    研究成果: Conference contribution同行評審

    1 引文 斯高帕斯(Scopus)

    摘要

    RF noise shielding methods with different coverage areas (Pad and TML shielding) were implemented in two port test structures adopting 100-nm MOSFETs. Noise measurement reveals an effective suppression of NFmin but increase of NF50, simultaneously from the shielding methods. The suppression of NFmin is contributed from the reduction of Re(Yopt) while the noise resistance Rn is kept nearly the same. A lossy substrate model developed in our original work for a standard structure without shielding can be easily extended based on the layout and topology of the shielding schemes to predict the noise shielding effect and explain the mechanisms. The extended lossy substrate model indicates that the elimination of substrate loss represented by substrate RLC networks is the major mechanism contributing the reduction of NFmin. However, the increase of parasitic capacitance generated from the shielding structures is responsible for the degradation of fT and NF50. The results provide an important insight and guideline for low noise RF circuit design.

    原文English
    主出版物標題2008 European Microwave Integrated Circuit Conference, EuMIC 2008
    頁面390-393
    頁數4
    DOIs
    出版狀態Published - 1 12月 2008
    事件2008 European Microwave Integrated Circuit Conference, EuMIC 2008 - Amsterdam, Netherlands
    持續時間: 27 10月 200831 10月 2008

    出版系列

    名字2008 European Microwave Integrated Circuit Conference, EuMIC 2008

    Conference

    Conference2008 European Microwave Integrated Circuit Conference, EuMIC 2008
    國家/地區Netherlands
    城市Amsterdam
    期間27/10/0831/10/08

    指紋

    深入研究「RF noise shielding method and modelling for nanoscale MOSFET」主題。共同形成了獨特的指紋。

    引用此