Residual Knowledge Retention for Edge Devices

Cheng Fu Liou, Paul Kuo, Jiun In Guo

研究成果: Conference contribution同行評審

1 引文 斯高帕斯(Scopus)

摘要

This paper proposes an approach for continual learning, Knowledge Retention (KR), that learns new information without accessing data from previous tasks. A KR unit is based on the embedding layer that identifies the important kernel in the convolution layer, which preserves key parameters and allows the weights to be reused across tasks. To construct higher-order generalization, we design a Residual Knowledge Retention (RKR) architecture that facilitates the network to stack deeper layers. Additionally, we rethink the benefits of different residual blocks respectively after employing depthwise convolutions. A surprising observation is that the basic block taking advantage of depthwise convolutions achieves higher representational power and builds a more lightweight model than the bottleneck block counterpart. On the Alternating CIFAR10/100 benchmark, we empirically show that the KR unit can be integrated into diverse networks and effectively prevents catastrophic forgetting. Finally, we demonstrate that RKR significantly outperforms the existing state-of-the-art continual learning methods with at least 6 times lower model complexity in two different scenarios for continual learning, which supports that the proposed approach is more competitive for resource-limited edge devices.

原文English
主出版物標題Proceedings of 2021 IEEE 30th International Symposium on Industrial Electronics, ISIE 2021
發行者Institute of Electrical and Electronics Engineers Inc.
ISBN(電子)9781728190235
DOIs
出版狀態Published - 20 6月 2021
事件30th IEEE International Symposium on Industrial Electronics, ISIE 2021 - Kyoto, Japan
持續時間: 20 6月 202123 6月 2021

出版系列

名字IEEE International Symposium on Industrial Electronics
2021-June

Conference

Conference30th IEEE International Symposium on Industrial Electronics, ISIE 2021
國家/地區Japan
城市Kyoto
期間20/06/2123/06/21

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