Reliability of ultrathin high-κ dielectrics on chemical-vapor deposited 2D semiconductors

Zhihao Yu, Hongkai Ning, Chao Ching Cheng, Weisheng Li, Lei Liu, Wanqing Meng, Zhongzhong Luo, Taotao Li, Songhua Cai, Peng Wang, Wen Hao Chang, Chao Hsin Chien, Yi Shi, Yong Xu, Lain Jong Li, Xinran Wang*

*此作品的通信作者

研究成果: Conference contribution同行評審

8 引文 斯高帕斯(Scopus)

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Material Science

Chemical Engineering

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