Reliability analysis of GaN-based UVLEDs under forward bias operations in salty vapor environment

  • Shen Che Huang
  • , Heng Li
  • , Yu Shan Lee
  • , Chen Hao Hung
  • , Shing Chung Wang
  • , Hsiang Chen
  • , Tien-chang Lu

研究成果: Conference contribution同行評審

1 引文 斯高帕斯(Scopus)

指紋

深入研究「Reliability analysis of GaN-based UVLEDs under forward bias operations in salty vapor environment」主題。共同形成了獨特的指紋。

Keyphrases

Engineering

Earth and Planetary Sciences