Reliability analysis of GaN-based UVLEDs under forward bias operations in salty vapor environment

Shen Che Huang, Heng Li, Yu Shan Lee, Chen Hao Hung, Shing Chung Wang, Hsiang Chen, Tien-chang Lu

研究成果: Conference contribution同行評審

1 引文 斯高帕斯(Scopus)

摘要

We illustrated the reliability of longer wavelength ultraviolet light-emitting diodes (UVLEDs) in salty vapour environment under manipulation of forward-bias stress via consistent electrical and material characterizations. By manipulating the unprecedented operation in salty vapour ambient, we investigated a series of remarkable findings related to origin of failure behaviours.

原文English
主出版物標題22nd Microoptics Conference, MOC 2017
發行者Institute of Electrical and Electronics Engineers Inc.
頁面306-307
頁數2
ISBN(電子)9784863486096
DOIs
出版狀態Published - 19 11月 2017
事件22nd Microoptics Conference, MOC 2017 - Tokyo, Japan
持續時間: 19 11月 201722 11月 2017

出版系列

名字22nd Microoptics Conference, MOC 2017
2017-November

Conference

Conference22nd Microoptics Conference, MOC 2017
國家/地區Japan
城市Tokyo
期間19/11/1722/11/17

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