@inproceedings{883741ba3f3143bf84cf7fa88443035b,
title = "Reliability analysis of GaN-based UVLEDs under forward bias operations in salty vapor environment",
abstract = "We illustrated the reliability of longer wavelength ultraviolet light-emitting diodes (UVLEDs) in salty vapour environment under manipulation of forward-bias stress via consistent electrical and material characterizations. By manipulating the unprecedented operation in salty vapour ambient, we investigated a series of remarkable findings related to origin of failure behaviours.",
author = "Huang, {Shen Che} and Heng Li and Lee, {Yu Shan} and Hung, {Chen Hao} and Wang, {Shing Chung} and Hsiang Chen and Tien-chang Lu",
note = "Publisher Copyright: {\textcopyright} 2017 The Japan Society of Applied Physics.; 22nd Microoptics Conference, MOC 2017 ; Conference date: 19-11-2017 Through 22-11-2017",
year = "2017",
month = nov,
day = "19",
doi = "10.23919/MOC.2017.8244608",
language = "English",
series = "22nd Microoptics Conference, MOC 2017",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "306--307",
booktitle = "22nd Microoptics Conference, MOC 2017",
address = "美國",
}