Record-High Memory Window and Robust Retention Anti-Fuse OTP Memory: Electrical and Reliability Characteristics

Dong Ru Hsieh, Jia Chian Ni, Wei Ju Yeh, Tzu Chieh Hong, Zi Yang Hong, Yan Kui Liang, Huai En Luo, Michael Hsu, Ta Chun Cho, Tien Sheng Chao*

*此作品的通信作者

研究成果: Conference contribution › 同行評審

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Keyphrases

Computer Science

Medicine and Dentistry