Recombination dynamics and carrier lifetimes in highly mismatched ZnTeO alloys

Yan Cheng Lin*, Ming Jui Tasi, Wu-Ching Chou, Wen-Hao Chang, Wei-Kuo Chen, Tooru Tanaka, Qixin Guo, Mitsuhiro Nishio

*此作品的通信作者

研究成果: Article同行評審

14 引文 斯高帕斯(Scopus)

指紋

深入研究「Recombination dynamics and carrier lifetimes in highly mismatched ZnTeO alloys」主題。共同形成了獨特的指紋。

Keyphrases

Engineering