摘要
The results of the experimental study of the low-temperature electron dephasing time (τφ) in metals and semiconductor mesoscopic structures were presented. The experiment was performed to determine the value of τφ in systems of different dimentionality and with different levels of disorder. Results showed that the dephasing in metal films is mainly due to electron-phonon (e-ph) scattering and electron-electron scattering is the main cause of dephasing in semiconductor quantum wires.
| 原文 | English |
|---|---|
| 頁（從 - 到） | R501-R596 |
| 頁數 | 96 |
| 期刊 | Journal of Physics Condensed Matter |
| 卷 | 14 |
| 發行號 | 18 |
| DOIs | |
| 出版狀態 | Published - 13 5月 2002 |