Rapid prediction of rram reset-state disturb by ramped voltage stress

Keyphrases

• Resistive Random Access Memory (ReRAM) 100%
• Rapid Prediction 100%
• Ramp Voltage Stress 100%
• Rram 100%
• Novel Technique 50%
• Reliability Analysis 50%
• Ramp Rate 50%
• State-based 50%
• Statistical Distribution 50%
• Rate-based Model 50%
• Linear Voltages 50%
• Constant Voltage Mode 50%
• Memory Data 50%
• Filament Model 50%
• Acceleration Model 50%
• Voltage Ramp 50%
• Poisson Area Scaling 50%
• Non-Poisson 50%
• Voltage Acceleration 50%
• Acceleration Parameter 50%

Engineering

• Resistive 100%
• Random Access Memory 100%
• Reliability Analysis 50%
• Measured Data 50%
• Statistical Distribution 50%
• Constant Voltage 50%
• Ramp Rate 50%