Quantum confinement effect in short-channel gate-all-around MOSFETs and its impact on the sensitivity of threshold voltage to process variations

Yu Sheng Wu*, Pin Su

*此作品的通信作者

    研究成果: Conference contribution › 同行評審

    5 引文 斯高帕斯（Scopus）

    指紋

    深入研究「Quantum confinement effect in short-channel gate-all-around MOSFETs and its impact on the sensitivity of threshold voltage to process variations」主題。共同形成了獨特的指紋。

    Keyphrases

    Engineering