Protection design against system-level ESD transient disturbance on display panels

Ming-Dou Ker*, Wan Yen Lin, Cheng Cheng Yen, Che Ming Yang, Tung Yang Chen, Shih Fan Chen

*此作品的通信作者

    研究成果: Conference contribution同行評審

    3 引文 斯高帕斯(Scopus)

    摘要

    A hardware/firmware system co-design has been proposed in this work to protect display electronic products against system-level electrostatic discharge (ESD) transient disturbance. By including transient detection circuit, the firmware can execute system recovery procedure to recover all electrical functions under system-level ESD tests. The transient detection circuit is designed to detect different positive and negative fast electrical transients and verified in a 0.13-μm CMOS process. The experimental results have confirmed that the proposed hardware/firmware design can successfully improve the susceptibility of display products against system-level ESD zapping.

    原文English
    主出版物標題2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010
    頁面438-441
    頁數4
    DOIs
    出版狀態Published - 2 8月 2010
    事件2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010 - Beijing, China
    持續時間: 12 4月 201016 4月 2010

    出版系列

    名字2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010

    Conference

    Conference2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010
    國家/地區China
    城市Beijing
    期間12/04/1016/04/10

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