Process-Strained Si (PSS) CMOS Technology Featuring 3D Strain Engineering

C. H. Ge*, C. C. Lin, C. H. Ko, C. C. Huang, Y. C. Huang, B. W. Chan, B. C. Perng, C. C. Sheu, P. Y. Tsai, L. G. Yao, C. L. Wu, T. L. Lee, C. J. Chen, C. T. Wang, S. C. Lin, Y. C. Yeo, Chen-Ming Hu

*此作品的通信作者

研究成果: Conference article同行評審

114 引文 斯高帕斯(Scopus)

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Engineering