Preparation of nano-scale patterns on the silicon oxide surface by dip-pen nanolithography

Jeng-Tzong Sheu*, C. H. Wu, H. H. Liu, Tien-Sheng Chao

*此作品的通信作者

研究成果: Conference contribution同行評審

摘要

Dip-pen nanolithography (DPN), which uses an "inked" AFM tip to deposit organic molecules through a water meniscus onto an underlying substrate under ambient conditions, has been used to create N-(2-aminoethyl)-3-amino- propyl-trimethoxysilane (AEAPTMS) nano patterns as linkers for anchoring gold nanoparticles on the surface of SiO2. In this study, conditions of DPN for organic patterns, AEAPTMS, with sub-100 nm dimensions are investigated. Moreover, gold nanoparticles with citrate-negativey-charged surface were deposited selectively on top of DPN orgainc patterns. Lateral force microscope (LFM) was utilized to differentiate different surface between oxidized semi-conductor surfaces and patterned areas with monolayer of AEAPTMS. Line-width as small as 60 nm has been successfully achieved by this method.

原文English
主出版物標題2005 5th IEEE Conference on Nanotechnology
頁面895-898
頁數4
DOIs
出版狀態Published - 1 12月 2005
事件2005 5th IEEE Conference on Nanotechnology - Nagoya, 日本
持續時間: 11 7月 200515 7月 2005

出版系列

名字2005 5th IEEE Conference on Nanotechnology
2

Conference

Conference2005 5th IEEE Conference on Nanotechnology
國家/地區日本
城市Nagoya
期間11/07/0515/07/05

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