Preparation and characterization of some tin oxide films

T. M. Uen*, Kai-Feng Huang, M. S. Chen, Y. S. Gou

*此作品的通信作者

研究成果: Article同行評審

36 引文 斯高帕斯(Scopus)

摘要

Tin oxide films were successfully prepared by the reactive evaporation method with a d.c. glow discharge of oxygen. The structure and composition of the films were characterized by Mössbauer spectroscopy, X-ray diffraction and scanning electron microscopy. The valency of tin atoms in the films determined by Mössbauer spectroscopy is mostly divalent in the samples prepared without discharge, but mostly tetravalent in the samples prepared with discharge. Measurements of electrical conductivity and Hall mobility were also carried out and the data were found to correlate with the concentration ratio [Sn4+]/[Sn2+] determined from Mössbauer spectroscopy.

原文English
頁(從 - 到)69-80
頁數12
期刊Thin Solid Films
158
發行號1
DOIs
出版狀態Published - 1 1月 1988

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