PREDICTING LUMINANCE DECAY OF A MICRO-LED DISPLAY VIA MACHINE LEARNING ON TEMPERATURE DISTRIBUTION AND LED DEGRADATION WITH IMPLEMENTATION BY FPGA

Chi En Lin, Hao Ren Chen, Paul C.P. Chao

研究成果: Conference contribution同行評審

1 引文 斯高帕斯(Scopus)

摘要

A new method for predicting the luminance decay of Micro Light Emitting Diode (Micro-LED) displays by machine learning models is proposed herein with experiments of temperature distribution and degradation established. Although Micro-LEDs can be used as a direct light source for large outdoor advertising billboards, harsh outdoor conditions may lead to the degradation of Micro-LED displays. As a result, a temperature model is first built to predict the temperature distribution for the surface of a Micro-LED display based on illuminated patterns and the temperature sensors installed on the back of the display, followed by the establishment of degradation model for predicting luminance decay of the display based on Micro-LED enclosure temperature, input current, and illumination time. In addition to the establishment of those models, the implementation integrating two models in hardware is done with Verilog and verified by Xilinx Artix-7. The temperature model owns a prediction error of less than 1.1°C in various tests, while the degradation model has an average error of 1.05% (roughly 9 nits) for green light. The operating frequency for implementation can reach 76.92 MHz.

原文English
主出版物標題Proceedings of the ASME 2023 32nd Conference on Information Storage and Processing Systems, ISPS 2023
發行者American Society of Mechanical Engineers
ISBN(電子)9780791887219
DOIs
出版狀態Published - 2023
事件ASME 2023 32nd Conference on Information Storage and Processing Systems, ISPS 2023 - Milpitas, 美國
持續時間: 28 8月 202329 8月 2023

出版系列

名字Proceedings of the ASME 2023 32nd Conference on Information Storage and Processing Systems, ISPS 2023

Conference

ConferenceASME 2023 32nd Conference on Information Storage and Processing Systems, ISPS 2023
國家/地區美國
城市Milpitas
期間28/08/2329/08/23

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