Precise determination of the dielectric constant and thickness of a nanolayer by use of surface plasmon resonance sensing and multiexperiment linear data analysis

Jin Jung Chyou*, Chih Sheng Chu, Fan Ching Chien, Chun Yu Lin, Tse Liang Yeh, Roy Chaoming Hsu, Shean Jen Chen

*此作品的通信作者

研究成果: Article › 同行評審

10 引文 斯高帕斯（Scopus）

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Keyphrases

Engineering

Material Science