Power-rail ESD clamp circuit with polysilicon diodes against false trigger during fast power-on events

Jie Ting Chen, Ming-Dou Ker

研究成果: Conference contribution同行評審

1 引文 斯高帕斯(Scopus)

摘要

A new power-rail ESD clamp circuit with both timing and voltage-level detection is proposed against false trigger events. A RC stage is used for dv/dt detection and a diode string is used to detect the over-stress voltage level during ESD events. By using fully isolated polysilicon diodes, the standby leakage current of the proposed power-rail ESD clamp can be effectively reduced.

原文English
主出版物標題Electrical Overstress/Electrostatic Discharge Symposium Proceedings, EOS/ESD 2018
發行者ESD Association
頁數7
ISBN(電子)1585373028
DOIs
出版狀態Published - 23 9月 2018
事件40th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2018 - Reno, United States
持續時間: 23 9月 201828 9月 2018

出版系列

名字Electrical Overstress/Electrostatic Discharge Symposium Proceedings
2018-September
ISSN(列印)0739-5159

Conference

Conference40th Annual Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2018
國家/地區United States
城市Reno
期間23/09/1828/09/18

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