Positive gate bias instability alleviated by self-passivation effect in amorphous InGaZnO thin-film transistors
GongTan Li, Bo-Ru Yang, Chuan Liu, Chia Yu Lee, Chih-Yuan Tseng, Chang-Cheng Lo, Alan Lien, Shaozhi Deng, Han-Ping Shieh, Ningsheng Xu
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斯高帕斯(Scopus)