Positive gate bias instability alleviated by self-passivation effect in amorphous InGaZnO thin-film transistors

GongTan Li, Bo-Ru Yang, Chuan Liu, Chia Yu Lee, Chih-Yuan Tseng, Chang-Cheng Lo, Alan Lien, Shaozhi Deng, Han-Ping Shieh, Ningsheng Xu

研究成果: Article同行評審

8 引文 斯高帕斯(Scopus)

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Engineering

Computer Science

Material Science