摘要
The influence of target texture on the backscattering yield of 2 MeV 4He particles has been investigated for evaported thin-film targets of Nb, Ag, Au and Bi. The results have been correlated with those from X-ray diffraction. The implications of the texture found for nuclear-backscattering analysis are discussed, and it is suggested that backscattering may constitute a fast, quantitative method for investigations of texture in thin foils.
原文 | English |
---|---|
頁(從 - 到) | 247-251 |
頁數 | 5 |
期刊 | Nuclear Instruments and Methods |
卷 | 149 |
發行號 | 1-3 |
DOIs | |
出版狀態 | Published - 1 1月 1978 |