Polarized optical scattering measurements of metallic nanoparticles on a thin film silicon wafer

Cheng Yang Liu*, Tze An Liu, Wei En Fu

*此作品的通信作者

研究成果: Conference contribution同行評審

指紋

深入研究「Polarized optical scattering measurements of metallic nanoparticles on a thin film silicon wafer」主題。共同形成了獨特的指紋。

Agriculture & Biology

Physics & Astronomy

Earth & Environmental Sciences