Polarization-dependent X-ray absorption spectroscopy of in-plane aligned (1 0 0) YBa2Cu3O 7-δ thin films

Chih-Wei Luo, S. J. Liu, M. H. Chen, Kaung-Hsiung Wu*, Jiunn-Yuan Lin, J. M. Chen, Jenh-Yih Juang, T. M. Uen, Y. S. Gou

*此作品的通信作者

研究成果: Conference article同行評審

摘要

Polarization-dependent X-ray absorption spectra (XAS) on the O 1s edge has been measured on a highly in-plane aligned (1 0 0) a-axis YBa2Cu3O7-δ (YBCO) thin films. The in-plane XAS, that is, the electric field E of the linearly polarized synchrotron light parallels to b- or c-axes of YBCO films (E∥b or E∥c), were obtained in a normal-incidence alignment. Furthermore, the XAS for E∥a was calculated from the oblique incidence to the sample with different angles. The present results are consistent with those obtained by using detwinned YBCO single crystals.

原文American English
頁(從 - 到)435-436
頁數2
期刊Physica C: Superconductivity and its applications
388-389
DOIs
出版狀態Published - 5月 2003
事件proceedings of the 23rd international conference on low temper - Hiroshima, Japan
持續時間: 20 8月 200227 8月 2002

指紋

深入研究「Polarization-dependent X-ray absorption spectroscopy of in-plane aligned (1 0 0) YBa2Cu3O 7-δ thin films」主題。共同形成了獨特的指紋。

引用此