Piezoresponse force microscopy imaging and its correlation with cantilever spring constant and frequency

O. Solis Canto, E. A. Murillo-Bracamontes, J. J. Gervacio-Arciniega, M. Toledo-Solano, G. Torres-Miranda, E. Cruz-Valeriano, Ying-hao Chu, M. A. Palomino-Ovando, C. I. Enriquez-Flores, M. E. Mendoza, H'Linh Hmok*, M. P. Cruz

*此作品的通信作者

研究成果: Article同行評審

1 引文 斯高帕斯(Scopus)

摘要

Single-frequency piezoresponse force microscopy (PFM) images of a BiFeO3/DyScO3(110) thin film, obtained with long (k(c)=0.82N/m) and short (k(c)=7.64N/m) cantilevers, were analyzed as a function of the applied voltage frequency. For long cantilevers, the electrostatic and electrostrictive contributions were identified. These contributions were reduced with a frequency near the second mode of the contact resonance; while for short cantilevers, the first mode was necessary. A method for domain structure analyses, to discriminate a ferroelectric behavior from a non-ferroelectric, through the optimization of PFM images, is also described. The analysis can be extended to cantilevers with different spring constants and ferroelectric materials.

原文English
文章編號084101
頁數9
期刊Journal of Applied Physics
128
發行號8
DOIs
出版狀態Published - 28 八月 2020

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