Physical origin of directional beaming emitted from a subwavelength slit

Liang Bin Yu*, Ding Zheng Lin, Yi-Chun Chen, You-Chia Chang, Kuo Tung Huang, Jiunn Woei Liaw, Jyi Tyan Yeh, Jonq Min Liu, Chau Shioung Yeh, Chih Kung Lee

*此作品的通信作者

研究成果: Article同行評審

167 引文 斯高帕斯(Scopus)

摘要

We propose the physical origin for a directional beam of light emitting from a single subwavelength slit in metallic film that is characterized by a corrugation feature at the exiting side of the film. We theorize that the beaming phenomenon can be explained simply as surface plasmon diffraction along the corrugation as long as the multiple scattering effects are taken into account to restate the dispersion relationship of the surface plasmon. In order to prove our theory, both an experimental setup and numerical simulations were undertaken. Results obtained match well with our theory of an explanation based on a surface plasmon diffraction scheme.

原文English
文章編號041405
期刊Physical Review B - Condensed Matter and Materials Physics
71
發行號4
DOIs
出版狀態Published - 1 1月 2005

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