Photoluminescence properties of self-assembled InN dots embedded in GaN grown by metal organic vapor phase epitaxy

W. C. Ke*, C. P. Fu, C. Y. Chen, L. Lee, C. S. Ku, Wu-Ching Chou, Wen-Hao Chang, M. C. Lee, Wei-Kuo Chen, W. J. Lin, Y. C. Cheng

*此作品的通信作者

研究成果: Article同行評審

67 引文 斯高帕斯(Scopus)

摘要

Photoluminescence (PL) properties of InN dots embedded in GaN were investigated. We observed a systematic blueshift in the emission energy as the average dot height was reduced. The widely size-tunable emission energy can be ascribed to the size quantization effect. Temperature-dependent PL measurements show that the emission peak energies of the dots are insensitive to temperature, as compared with that of bulk film, indicating the localization of carriers in the dots. A reduced quenching of the PL from the InN dots was also observed, implying superior emission properties for the embedded InN dot structures.

原文English
文章編號191913
頁(從 - 到)1-3
頁數3
期刊Applied Physics Letters
88
發行號19
DOIs
出版狀態Published - 8 5月 2006

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