Phase-modulated ellipsometry for probing the temperature-induced phase transition in ruthenium-doped lead zinc niobate-lead titanate single crystal

Chun I. Chuang; Vera Marinova; Shiuan-Huei Lin; Yu Faye Chao

doi:10.1016/j.tsf.2010.12.085

Phase-modulated ellipsometry for probing the temperature-induced phase transition in ruthenium-doped lead zinc niobate-lead titanate single crystal

Chun I. Chuang, Vera Marinova, Shiuan-Huei Lin, Yu Faye Chao^*

^*此作品的通信作者

電子物理學系

研究成果: Article › 同行評審

摘要

Phase-modulated ellipsometry was applied to measure changes in the refractive index of pure and ruthenium (Ru)-doped 0.9Pb (Zn_1/3Nb _2/3)O₃ (PZN)-0.1PbTiO₃ (PT) during the heating process in real time. Both samples were heated from room temperature to 200 °C in a thermally insulated chamber. In both samples, the phase transitions were observed to change from tetragonal to cubic. The temperature region at which the phase transition (Curie region) of Ru-doped 0.9PZN-0.1PT occurred not only broadened but also shifted to a lower temperature. The refractive indices were extremely stable in this region, meaning that Ru-doped 0.9PZN-0.1PT is a more favorable medium for the fabrication of optical memories.

原文	English
頁（從 - 到）	2867-2869
頁數	3
期刊	Thin Solid Films
卷	519
發行號	9
DOIs	https://doi.org/10.1016/j.tsf.2010.12.085
出版狀態	Published - 28 2月 2011

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10.1016/j.tsf.2010.12.085

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title = "Phase-modulated ellipsometry for probing the temperature-induced phase transition in ruthenium-doped lead zinc niobate-lead titanate single crystal",

abstract = "Phase-modulated ellipsometry was applied to measure changes in the refractive index of pure and ruthenium (Ru)-doped 0.9Pb (Zn1/3Nb 2/3)O3 (PZN)-0.1PbTiO3 (PT) during the heating process in real time. Both samples were heated from room temperature to 200 °C in a thermally insulated chamber. In both samples, the phase transitions were observed to change from tetragonal to cubic. The temperature region at which the phase transition (Curie region) of Ru-doped 0.9PZN-0.1PT occurred not only broadened but also shifted to a lower temperature. The refractive indices were extremely stable in this region, meaning that Ru-doped 0.9PZN-0.1PT is a more favorable medium for the fabrication of optical memories.",

keywords = "Curie region, Ellipsometry, Perovskite, Refractive index",

author = "Chuang, {Chun I.} and Vera Marinova and Shiuan-Huei Lin and Chao, {Yu Faye}",

year = "2011",

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T1 - Phase-modulated ellipsometry for probing the temperature-induced phase transition in ruthenium-doped lead zinc niobate-lead titanate single crystal

AU - Chuang, Chun I.

AU - Marinova, Vera

AU - Lin, Shiuan-Huei

AU - Chao, Yu Faye

PY - 2011/2/28

Y1 - 2011/2/28

N2 - Phase-modulated ellipsometry was applied to measure changes in the refractive index of pure and ruthenium (Ru)-doped 0.9Pb (Zn1/3Nb 2/3)O3 (PZN)-0.1PbTiO3 (PT) during the heating process in real time. Both samples were heated from room temperature to 200 °C in a thermally insulated chamber. In both samples, the phase transitions were observed to change from tetragonal to cubic. The temperature region at which the phase transition (Curie region) of Ru-doped 0.9PZN-0.1PT occurred not only broadened but also shifted to a lower temperature. The refractive indices were extremely stable in this region, meaning that Ru-doped 0.9PZN-0.1PT is a more favorable medium for the fabrication of optical memories.

AB - Phase-modulated ellipsometry was applied to measure changes in the refractive index of pure and ruthenium (Ru)-doped 0.9Pb (Zn1/3Nb 2/3)O3 (PZN)-0.1PbTiO3 (PT) during the heating process in real time. Both samples were heated from room temperature to 200 °C in a thermally insulated chamber. In both samples, the phase transitions were observed to change from tetragonal to cubic. The temperature region at which the phase transition (Curie region) of Ru-doped 0.9PZN-0.1PT occurred not only broadened but also shifted to a lower temperature. The refractive indices were extremely stable in this region, meaning that Ru-doped 0.9PZN-0.1PT is a more favorable medium for the fabrication of optical memories.

KW - Curie region

KW - Ellipsometry

KW - Perovskite

KW - Refractive index

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DO - 10.1016/j.tsf.2010.12.085

M3 - Article

AN - SCOPUS:79952631090

SN - 0040-6090

VL - 519

SP - 2867

EP - 2869

JO - Thin Solid Films

JF - Thin Solid Films

IS - 9

ER -

Phase-modulated ellipsometry for probing the temperature-induced phase transition in ruthenium-doped lead zinc niobate-lead titanate single crystal

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