Performance degradation of RFID system due to curving in tag antenna through radar cross section (RCS) analysis

  • Heng-Tung Hsu*
  • , Hsi Tseng Chou
  • , Wen Wen Lee
  • *此作品的通信作者

研究成果: Conference contribution同行評審

4 引文 斯高帕斯(Scopus)

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Keyphrases

Engineering

Physics